Abstract The reformation and characterisation of the passive film formed on ultra-thin 316 L after hydrogen charging is investigated by combining EBSD, TMDS, freetress deep twist crochet hair 14 inch XRD, Synchrotron-based XPS, and electrochemical experiments.The results show that ultra-thin foil reforms a passive film after 12 h of hydrogen release in NaCl solution.The reformed passive film barely buff gelish is half the thickness of the as-received passive film and is dominated by Cr oxides/hydroxides.
The lattice extension caused by residual hydrogen accelerates Cr migration to form Cr2O3; while the diffusible hydrogen occupies the cation vacancies and results in high defect density for the reformed passive film within 12 h.